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Woodhead Publishing Limited , pp. xiii + 340 . Hardback. Used.
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Electromigration In Thin Films And Electronic Devices: Materials And Reliability ISBN 13: 9781845699376
ISBN 10: 1845699378
Hardcover; Cambridge: Woodhead Publishing, 2011; ISBN-13: 978-1845699376
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Electromigration in Thin Films and Electronic Devices
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Electromigration In Thin Films And Electronic Devices: Materials And Reliability
by Kim C-U
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United States: Woodhead Publishing, 2011. Hardbound. Brand New. Book Condition:- Brand New. Secured Packaging. Fast DeliveryBookseller Inventory # 9781845699376
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Electromigration In Thin Films And Electronic Devices: Materials And Reliability
by Kim C-U
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Woodhead Publishing, 2011. Paperback. New.
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