Skip to content

Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability Hardcover - 2011

by Kim C-U


Details

  • Title Electromigration In Thin Films And Electronic Devices: Materials And Reliability
  • Author Kim C-U
  • Binding Hardcover
  • Edition INTERNATIONAL ED
  • Pages 340
  • Language ENG
  • Publisher Woodhead Publishing, Cambridge
  • Date 2011
  • ISBN 9781845699376
Back to Top

More Copies for Sale

Electromigration in Thin Films and Electronic Devices
Stock Photo: Cover May Be Different

Electromigration in Thin Films and Electronic Devices

  • Used
  • Hardcover
Condition
Used
Binding
Hardcover
ISBN 10 / ISBN 13
9781845699376 / 1845699378
Quantity Available
1
Seller
Woodside, New York, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
CA$275.86
CA$5.54 shipping to USA

Show Details

Description:
Woodhead Publishing Limited , pp. xiii + 340 . Hardback. Used.
Item Price
CA$275.86
CA$5.54 shipping to USA
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Hardcover
Condition
Brand New
Binding
Hardcover
ISBN 10 / ISBN 13
9781845699376 / 1845699378
Quantity Available
1
Seller
New Delhi, India
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
CA$438.46
FREE shipping to USA

Show Details

Description:
United States: Woodhead Publishing, 2011. Hardbound. Brand New. Book Condition:- Brand New. Secured Packaging. Fast DeliveryBookseller Inventory # 9781845699376
Item Price
CA$438.46
FREE shipping to USA
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Paperback
Condition
New
Binding
Paperback
ISBN 10 / ISBN 13
9781845699376 / 1845699378
Quantity Available
200
Seller
New Delhi, Andaman and Nicobar Islands, India
Seller rating:
This seller has earned a 3 of 5 Stars rating from Biblio customers.
Item Price
CA$616.22
CA$20.83 shipping to USA

Show Details

Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
CA$616.22
CA$20.83 shipping to USA
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Paperback
Condition
New
Binding
Paperback
ISBN 10 / ISBN 13
9781845699376 / 1845699378
Quantity Available
200
Seller
New Delhi, India
Seller rating:
This seller has earned a 2 of 5 Stars rating from Biblio customers.
Item Price
CA$616.22
CA$20.83 shipping to USA

Show Details

Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
CA$616.22
CA$20.83 shipping to USA