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Design and Test Technology for Dependable Systems-on-Chip Hardcover - 2011 - 1st Edition
by Raimund Ubar (Editor); Jaan Raik (Editor); Heinrich Theodor Vierhaus (Editor)
Details
- Title Design and Test Technology for Dependable Systems-on-Chip
- Author Raimund Ubar (Editor); Jaan Raik (Editor); Heinrich Theodor Vierhaus (Editor)
- Binding Hardcover
- Edition number 1st
- Edition 1
- Pages 580
- Volumes 1
- Language ENG
- Publisher Information Science Reference
- Date 2011-03-31
- Features Bibliography, Index, Table of Contents
- ISBN 9781609602123 / 1609602129
- Weight 3.55 lbs (1.61 kg)
- Dimensions 11.2 x 8.6 x 1.4 in (28.45 x 21.84 x 3.56 cm)
-
Themes
- Aspects (Academic): Science/Technology Aspects
- Library of Congress Catalog Number 2010045850
- Dewey Decimal Code 621.381
Media reviews
Citations
- Reference and Research Bk News, 06/01/2011, Page 307
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Design and Test Technology for Dependable Systems-on-Chip
by Raimund Ubar
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Design & Test Technology For Dependable Systems On Chip
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