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Stress-Induced Phenomena in Metallization: Avs Series 13
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Stress-Induced Phenomena in Metallization: Avs Series 13 Hardcover - 1998

by C. y. Li (Editor); P. Totta (Editor); P. S. Ho (Editor)


From the publisher

From a September 1991 international workshop in Ithaca, New York, 18 papers address the growing concern over the impact of stress-induced voiding and related phenomena on reliability in very large scale integrated circuits, as the circuit features become ever smaller and challenge the capabilities o

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  • Title Stress-Induced Phenomena in Metallization: Avs Series 13
  • Author C. y. Li (Editor); P. Totta (Editor); P. S. Ho (Editor)
  • Binding Hardcover
  • Edition 1st
  • Pages 288
  • Volumes 1
  • Language ENG
  • Publisher American Institute of Physics
  • Date March 27, 1998
  • ISBN 9781563960826 / 1563960826
  • Weight 1.32 lbs (0.60 kg)
  • Dimensions 9.48 x 6.5 x 0.8 in (24.08 x 16.51 x 2.03 cm)
  • Library of Congress subjects Semiconductors - Defects - Congresses, Metallic films - Congresses
  • Library of Congress Catalog Number 92072292
  • Dewey Decimal Code 621.381
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Stress-Induced Phenomena in Metallization (American Vacuum Society Series, No. 13, AIP Conference...
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Stress-Induced Phenomena in Metallization (American Vacuum Society Series, No. 13, AIP Conference Proceedings, No. 263)

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Stress-Induced Phenomena in Metallization (American Vacuum Society Series, No. 13, AIP Conference Proceedings, No. 263)

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Stress-induced Phenomena in Metallization
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