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Frontiers of Characterization and Metrology for Nanoelectronics: 2007
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano Hardcover - 2007 - 1st Edition

by David G. Seiler (Editor); Alain C. Diebold (Editor); Robert McDonald (Editor)


From the publisher

"All papers have been peer-reviewed." Previous conferences entitled: International Conference on Characterization and Metrology for ULSI Technology. Includes bibliographical references and indexes. System requirements for accompanying CD-ROM: Adobe Acrobat Reader, 7.0.1 or later.

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  • Title Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano
  • Author David G. Seiler (Editor); Alain C. Diebold (Editor); Robert McDonald (Editor)
  • Binding Hardcover
  • Edition number 1st
  • Edition 1
  • Pages 578
  • Volumes 1
  • Language ENG
  • Publisher American Institute of Physics
  • Date 2007-09
  • Illustrated Yes
  • ISBN 9780735404410 / 0735404410
  • Weight 3.5 lbs (1.59 kg)
  • Dimensions 10.89 x 8.69 x 1.43 in (27.66 x 22.07 x 3.63 cm)
  • Library of Congress subjects Integrated circuits - Ultra large scale, Nanoelectronics
  • Library of Congress Catalog Number 2007933649
  • Dewey Decimal Code 621.381
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on...
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Frontiers Of Characterization And Metrology For Nanoelectronics

Frontiers Of Characterization And Metrology For Nanoelectronics

by Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-C. Michael Garner; Editor-Dan Herr; Editor-Rajinder P. Khosla; Editor-Erik M. Secula

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