Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1995. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 95CH35786. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia. ISBN 13: 9780780326224
ISBN 10: 0780326229
Hardcover; New York, Ny, U.s.a.: The Institute Of Electrical And Electronic Engineers, Inc, 1995-01; ISBN-13: 978-0780326224
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Stock Photo: Cover May Be Different
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia.
by IEEE
- Used
- Very Good
- Hardcover
- first
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- Used - Very Good
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- 1st Edition.
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- Hardcover
- ISBN 10 / ISBN 13
- 9780780326224 / 0780326229
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NEWARK, Ohio, United States
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CA$57.93CA$7.59 shipping to USA
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CA$7.59
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