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Test Generation for VLSI Chips

Test Generation for VLSI Chips

Test Generation for VLSI Chips
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Test Generation for VLSI Chips

by Agrawal, Vishwani; Seth, Sharad C

  • Used
  • very good
  • Hardcover
Condition
Very Good
ISBN 10
081868786X
ISBN 13
9780818687860
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This seller has earned a 5 of 5 Stars rating from Biblio customers.
Vancouver, Washington, United States
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About This Item

Computer Society Press, 1988. hardcover in very good + condition.. Hardcover. Very Good.

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Details

Bookseller
Rob Briggs Books US (US)
Bookseller's Inventory #
600383
Title
Test Generation for VLSI Chips
Author
Agrawal, Vishwani; Seth, Sharad C
Format/Binding
Hardcover
Book Condition
Used - Very Good
Quantity Available
1
ISBN 10
081868786X
ISBN 13
9780818687860
Publisher
Computer Society Press
Date Published
1988
Keywords
INTEGRATED CIRCUITS_VERY LARGE SCALE INTEGRATION
Bookseller catalogs
Computers;

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Rob Briggs Books

If book is not described correctly you may return it within 3 weeks of purchase.

About the Seller

Rob Briggs Books

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2005
Vancouver, Washington

About Rob Briggs Books

We specialize in non-fiction technical books and college textbooks.
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