At&t Reliability Manual by David J. Klinger [Editor]; Yoshinao Nakada [Editor]; Maria A. Menendez [Editor];

UsedGood. Shows minimal wear such as frayed or folded edges, minor rips and tears, and/or slightly worn binding. May have stickers and/or contain inscription on title page. No observed missing pages.

UsedGood. Book is in good condition and may contain underlining or highlighting and minimal wear. The book can also include library labels. May not contain miscellaneous items (toys, dvds, etc). We offer 100% money back guarantee and fast customer support.

Springer, 1999. Hardcover. Good. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.

New York: Van Nostrand Reinhold Company, 1990. Hardcover. As New/As New. Gilt lettering on blue covers in a blue pictorial dust jacket. 4to, 226pp.

Springer, 1999-02-03. Hardcover. New. New. In shrink wrap. Looks like an interesting title!

Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The At&t Reliability Manual.

Hardback. New. Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.

New York: Van Nostrand Reinhold, 1990. Comprehensive text provides electronics systems engineers concepts, measures, methods, and latest component reliability data based on more than 30 years of performance trials. Includes the first complete elucidation of AT&T's reliability model- the detailed table of component hazard rates from actual field data; system evaluation and performance monitoring; device assessment; physical and methematical derivations; etc. 223 pgs. Illustrated. Prior owner's name on front endpaper. Dustjacket in mylar.. First Edition. Hard Cover. Fine/Fine. 4to - over 9¾" - 12" tall.